Small-Signal Performance and Modeling of sub-50nm nMOSFETs with f above 460-GHz.

نویسندگان

  • V Dimitrov
  • J Heng
  • K Timp
  • O Dimauro
  • R Chan
  • M Hafez
  • J Feng
  • T Sorsch
  • W Mansfield
  • J Miner
  • A Kornblit
  • F Klemens
  • J Bower
  • R Cirelli
  • E J Ferry
  • A Taylor
  • M Feng
  • G Timp
چکیده

We have fabricated and tested the performance of sub-50nm gate nMOSFETs to assess their suitability for mixed signal applications in the super high frequency (SHF) band, i.e. 3-30GHz. For a 30nm×40 μm×2 device, we found f(T) =465GHz at V(ds)=2V, V(g)=0.67V, which is the highest cut-off frequency reported for a MOSFET produced on bulk silicon substrate so far. However, our measurements of f(max) and noise figure indicate that parasitics impose limitations on SHF operation. We also present a high-frequency ac model appropriate to sub-50nm gate length nanotransistors, which incorporates the effects of the parasitics. The model accurately accounts for measurements of the S and Y parameters in the frequency range from 1 to 50GHz.

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عنوان ژورنال:
  • Solid-state electronics

دوره 52 6  شماره 

صفحات  -

تاریخ انتشار 2008